XIANG, Dongsheng; XIA, Zijin; WANG, Yueyang. Measurement of SiC Epilayer Thickness Using Infrared Interferometry. International Journal of Advanced Engineering and Technology Research, [S. l.], v. 2, n. 1, p. 126–130, 2026. DOI: 10.54097/rmhqht20. Disponível em: https://ijaetr.org/index.php/ojs/article/view/101. Acesso em: 16 sep. 2026.